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Title: The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy

Aberration correction in scanning/transmission electron microscopy (S/TEM) owes much to the efforts of a small dedicated group of innovators. Leading that frontier has been Prof. Harald Rose. To date his leadership and dynamic personality has spearheaded our ability to leave behind many of the limitations imposed by spherical aberration (Cs) in high resolution phase contrast imaging. Following shortly behind, has been the development of chromatic aberration correction (Cc) which augments those accomplishments. In this study we will review and summarize how the combination of Cs/Cc technology enhances our ability to conduct hyperspectral imaging and spectroscopy in today's and future computationally mediated experiments in both thin as well as realistic specimens in vacuo and during in-situ/environmental experiments.
Authors:
 [1]
  1. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
OSTI Identifier:
1339285
Grant/Contract Number:
AC02-06CH11357
Type:
Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Volume: 151; Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; AEM; aberration correction; amplitude contrast; EELS; EFTEM; HREM; phase contrast; XEDS; in-situ; tomography