skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Optimization of Compton Source Performance through Electron Beam Shaping

Technical Report ·
DOI:https://doi.org/10.2172/1329533· OSTI ID:1329533
 [1];  [1]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

We investigate a novel scheme for significantly increasing the brightness of x-ray light sources based on inverse Compton scattering (ICS) - scattering laser pulses off relativistic electron beams. The brightness of ICS sources is limited by the electron beam quality since electrons traveling at different angles, and/or having different energies, produce photons with different energies. Therefore, the spectral brightness of the source is defined by the 6d electron phase space shape and size, as well as laser beam parameters. The peak brightness of the ICS source can be maximized then if the electron phase space is transformed in a way so that all electrons scatter off the x-ray photons of same frequency in the same direction, arriving to the observer at the same time. We describe the x-ray photon beam quality through the Wigner function (6d photon phase space distribution) and derive it for the ICS source when the electron and laser rms matrices are arbitrary.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC52-06NA25396
OSTI ID:
1329533
Report Number(s):
LA-UR-16-27330; TRN: US1700377
Country of Publication:
United States
Language:
English

Similar Records

Compact x-ray source based on burst-mode inverse Compton scattering at 100 kHz
Journal Article · Mon Dec 01 00:00:00 EST 2014 · Physical Review Special Topics. Accelerators and Beams · OSTI ID:1329533

Single shot, double differential spectral measurements of inverse Compton scattering in the nonlinear regime
Journal Article · Mon Jun 05 00:00:00 EDT 2017 · Physical Review Accelerators and Beams · OSTI ID:1329533

First refraction contrast imaging via Laser-Compton Scattering X-ray at KEK
Journal Article · Tue Jul 31 00:00:00 EDT 2012 · AIP Conference Proceedings · OSTI ID:1329533