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Title: A multi-cone x-ray imaging Bragg crystal spectrometer

This article describes a new x-ray imaging Bragg crystal spectrometer, which—in combination with a streak camera or a gated strip detector—can be used for time-resolved measurements of x-ray line spectra at the National Ignition Facility and other high power laser facilities. The main advantage of this instrument is that it produces perfect images of a point source for each wavelength in a selectable spectral range and that the detector plane can be perpendicular to the crystal surface or inclined by an arbitrary angle with respect to the crystal surface. Furthermore, these unique imaging properties are obtained by bending the x-ray diffracting crystal into a certain shape, which is generated by arranging multiple cones with different aperture angles on a common nodal line.
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  1. Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)
Publication Date:
OSTI Identifier:
Report Number(s):
Journal ID: ISSN 0034-6748; RSINAK; TRN: US1700166
Grant/Contract Number:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 11; Journal ID: ISSN 0034-6748
American Institute of Physics (AIP)
Research Org:
Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)
Sponsoring Org:
Country of Publication:
United States
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; image sensors; X-ray imaging; X-ray spectrometers; X-ray detectors; X-ray lasers