Evidence for impact ionization in vanadium dioxide

Holleman, Joshua; Bishop, Michael M.; Garcia, Carlos; Vellore Winfred, J. S.  R.; Lee, Shinbuhm; Lee, Ho Nyung; Beekman, Christianne; Manousakis, Efstratios; McGill, Stephen A.

doi:10.1103/PhysRevB.94.155129

Title: Evidence for impact ionization in vanadium dioxide

Journal Article · Mon Oct 17 00:00:00 EDT 2016 · Physical Review B

DOI:https://doi.org/10.1103/PhysRevB.94.155129· OSTI ID:1339356

Holleman, Joshua ^[1]; Bishop, Michael M. ^[2]; Garcia, Carlos ^[1]; Vellore Winfred, J. S. R. ^[2]; Lee, Shinbuhm ^[3]; Lee, Ho Nyung ^[3]; Beekman, Christianne ^[1]; Manousakis, Efstratios ^[1]; McGill, Stephen A. ^[2]

Florida State Univ., Tallahassee, FL (United States). National High Magnetic Field Lab. (MagLab); Florida State Univ., Tallahassee, FL (United States). Dept. of Physics
Florida State Univ., Tallahassee, FL (United States). National High Magnetic Field Lab. (MagLab)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science & Technology Division

Pump-probe optical spectroscopy was used to investigate charge carrier multiplication via impact ionization in the M₁ insulating phase of VO₂. By comparing the transient reflectivities of the film when pumped at less than and then more than twice the band-gap energy, we observed an enhancement of the ultrafast response with the higher energy pump color while the film was still transiently in the insulating phase. We additionally identified multiple timescales within the charge dynamics and analyzed how these changed when the pump and probe wavelengths were varied. This experiment provided evidence that impact ionization acts efficiently as a carrier multiplication process in this prototypical strongly-correlated insulator.

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Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC05-00OR22725; DMR-1229217; DMR-1157490

OSTI ID:: 1339356

Alternate ID(s):: OSTI ID: 1329101

Journal Information:: Physical Review B, Vol. 94, Issue 15; ISSN 2469-9950

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 12 works

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