skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Understanding misfit strain releasing mechanisms via molecular dynamics simulations of CdTe growth on {112}zinc-blende CdS

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4959609· OSTI ID:1328122
 [1];  [2];  [2];  [2]
  1. Sandia National Lab. (SNL-CA), Livermore, CA (United States)
  2. Univ. of Texas at El Paso, El Paso, TX (United States)

Molecular dynamics simulations have been used to analyse microstructures of CdTe films grown on {112} surfaces of zinc-blende CdS. Interestingly, CdTe films grow in <331> orientations as opposed to <112> epitaxial orientations. At the CdTe-{331}/CdS-{112} interface, however, there exists an axis that is parallel to the <110> orientation of both CdS and CdTe. It is the direction orthogonal to this <110> that becomes different, being <116> for CdTe and <111> for CdS, respectively. Missing CdTe-{110} planes are found along the <110> axis, suggesting that the misfit strain is released by the conventional misfit dislocation mechanism along this axis. In the orthogonal axis, the misfit strain is found to be more effectively released by the new grain orientation mechanism. Our finding is supported by literature experimental observations of the change of growth direction when Cd0.96Zn0.04Te films are deposited on GaAs. Lastly the analyses of energetics clearly demonstrate the cause for the formation of the new orientation, and the insights gained from our studies can help understand the grain structures experimentally observed in lattice mismatched systems.

Research Organization:
Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC04-94AL85000
OSTI ID:
1328122
Report Number(s):
SAND-2015-6849J; JAPIAU; 598961
Journal Information:
Journal of Applied Physics, Vol. 120, Issue 4; ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 8 works
Citation information provided by
Web of Science

References (23)

Minority carrier lifetime variations associated with misfit dislocation networks in heteroepitaxial GaInP journal April 2010
Colloidal nanocrystal heterostructures with linear and branched topology journal July 2004
Critical layer thickness for misfit dislocation stability in multilayer structures journal April 1990
Mechanical properties of thin films journal November 1989
Theoretical comparison of the stability characteristics of capped and uncapped GexSi1−x strained epilayers journal August 1992
A new study of critical layer thickness, stability and strain relaxation in pseudomorphic ge x si 1-x strained epilayers journal May 1992
Catalyst-Assisted Solution−Liquid−Solid Synthesis of CdS/CdSe Nanorod Heterostructures journal January 2007
Structural and optical investigations on CdS thin films grown by chemical bath technique journal February 2001
Atomistic simulation of the vapor deposition of Ni/Cu/Ni multilayers: Incident adatom angle effects journal January 2000
Microstructural Characterization of CdTe(211)B/ZnTe/Si(211) Heterostructures Grown by Molecular Beam Epitaxy journal June 2011
Calculation of critical-layer-thickness and strain relaxation in GexSi1−x strained layers with interacting 60 and 90° dislocations journal March 1993
An atomistically validated continuum model for strain relaxation and misfit dislocation formation journal June 2016
A molecular dynamics study of nickel vapor deposition: Temperature, incident angle, and adatom energy effects journal April 1997
Molecular Dynamics Simulations of CdTe / CdS Heteroepitaxy - Effect of Substrate Orientation journal April 2016
Critical layer thicknesses for inclined dislocation stability in multilayer structures journal August 1992
III–nitrides: Growth, characterization, and properties journal February 2000
The energetics of dislocation array stability in strained epitaxial layers journal June 1993
High-fidelity simulations of CdTe vapor deposition from a bond-order potential-based molecular dynamics method journal June 2012
The energy of an array of dislocations: Implications for strain relaxation in semiconductor heterostructures journal July 1990
Stillinger-Weber potential for the II-VI elements Zn-Cd-Hg-S-Se-Te journal August 2013
HREM studies of twins in Cd1−xZnxTe (x≈0.04) thin films grown by molecular beam epitaxy journal September 2009
Electrochemical Fabrication of CdS Nanowire Arrays in Porous Anodic Aluminum Oxide Templates journal January 1996
Misfit strain and misfit dislocations in lattice mismatched epitaxial layers and other systems journal June 1997

Cited By (3)

Altering thermal transport by strained-layer epitaxy journal May 2018
Predictive modeling of misfit dislocation induced strain relaxation effect on self-rolling of strain-engineered nanomembranes journal September 2018
Vacancy-assisted core transformation and mobility modulation of a-type edge dislocations in wurtzite GaN journal September 2019

Similar Records

High resolution lattice imaging of the CdS/CdTe interface
Conference · Wed Sep 01 00:00:00 EDT 1982 · Conf. Rec. IEEE Photovoltaic Spec. Conf.; (United States) · OSTI ID:1328122

Molecular beam epitaxy of CdTe on GaAs substrates and HgCdTe on CdTe/GaAs alternate substrates
Miscellaneous · Fri Dec 31 00:00:00 EST 1993 · OSTI ID:1328122

Structure and electrical properties of CdS and CdTe thick films for solar cell applications
Conference · Wed Jan 01 00:00:00 EST 1975 · J. Vac. Sci. Technol.; (United States) · OSTI ID:1328122