Correlation of Lifetime Mapping of 4H-SiC Epilayers with Structural Defects Using Synchrotron X-Ray Topography
Journal Article
·
· Materials Science Forum (Online)
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Sponsoring Organization:
- DOE - BASIC ENERGY SCIENCES
- OSTI ID:
- 1328036
- Journal Information:
- Materials Science Forum (Online), Vol. 858, Issue 05, 2016; ISSN 1662-9752
- Publisher:
- Trans Tech Publications
- Country of Publication:
- United States
- Language:
- ENGLISH
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