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Title: Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis

Authors:
; ;
Publication Date:
OSTI Identifier:
1327043
Resource Type:
Journal Article
Resource Relation:
Journal Name: Powder Diffraction; Journal Volume: 29; Journal Issue: 01
Publisher:
Cambridge University Press
Research Org:
Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)
Sponsoring Org:
DOE - BASIC ENERGY SCIENCESNSF
Country of Publication:
United States
Language:
ENGLISH