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Title: Reliable High-Performance Gate Oxides for Wide Band Gap Devices.

Abstract not provided.
Authors:
;
Publication Date:
OSTI Identifier:
1325523
Report Number(s):
SAND2015-7789C
603675
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the 2016 DOE OE ESS Peer Review held September 22-24, 2015 in Portland, OR.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE Office of Electricity Delivery and Energy Reliability (OE)
Country of Publication:
United States
Language:
English