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Title: A Characterization Technique for Nanosecond Gated CMOS X-Ray Cameras

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
OSTI Identifier:
1321419
Report Number(s):
LLNL-CONF-700381
DOE Contract Number:
AC52-07NA27344
Resource Type:
Conference
Resource Relation:
Conference: Presented at: SPIE 2016, San Diego, CA, United States, Aug 28 - Sep 01, 2016
Research Org:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 42 ENGINEERING