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Title: Validation of the Dynamic Recrystallization (DRX) Mechanism for Whisker and Hillock Growth in Thin Films.

Abstract not provided.
Authors:
; ; ;
Publication Date:
OSTI Identifier:
1319745
Report Number(s):
SAND2014-19489C
Journal ID: ISSN 0361--5235; 541011
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Journal Volume: 44; Journal Issue: 10; Conference: Proposed for presentation at the 8th International Symposium on Sn Whiskers held October 29, 2014 in Raleigh, NC.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); Sandia National Laboratories, Kansas City, MO
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English