Validation of the Dynamic Recrystallization (DRX) Mechanism for Whisker and Hillock Growth in Thin Films.
Abstract not provided.
- Publication Date:
- OSTI Identifier:
- Report Number(s):
Journal ID: ISSN 0361--5235; 541011
- DOE Contract Number:
- Resource Type:
- Resource Relation:
- Journal Volume: 44; Journal Issue: 10; Conference: Proposed for presentation at the 8th International Symposium on Sn Whiskers held October 29, 2014 in Raleigh, NC.
- Research Org:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); Sandia National Laboratories, Kansas City, MO
- Sponsoring Org:
- USDOE National Nuclear Security Administration (NNSA)
- Country of Publication:
- United States
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