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Title: Mapping of Radiation-Induced Resistance Changes and Multiple Conduction Channels in TaOx Memristors.

Abstract not provided.
Authors:
; ; ; ; ; ; ; ; ; ; ;
Publication Date:
OSTI Identifier:
1315344
Report Number(s):
SAND2014-15688C
533648
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the 2014 IEEE NSREC held July 14-18, 2014 in dsfdsfdsffs, France.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English