skip to main content

Title: Reliability Characterization of Wide-Bandgap Semiconductor Switches.

Abstract not provided.
Authors:
; ; ; ;
Publication Date:
OSTI Identifier:
1314228
Report Number(s):
SAND2013-8716C
533424
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Electrical Energy Storage Applications and Technologies held October 21-23, 2013 in San Diego, CA.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English