A new experimental tool for studies of low level radiation damage in semiconductor materials and devices.
Conference
·
OSTI ID:1307280
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1307280
- Report Number(s):
- SAND2015-7028C; 601147
- Resource Relation:
- Conference: Proposed for presentation at the 28th International Conference on Defects in Semiconductors held July 27-31, 2015 in Espoo, Finland.
- Country of Publication:
- United States
- Language:
- English
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