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Title: A new experimental tool for studies of low level radiation damage in semiconductor materials and devices.

Abstract not provided.
Authors:
; ; ; ; ; ; ;
Publication Date:
OSTI Identifier:
1307280
Report Number(s):
SAND2015-7028C
601147
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the 28th International Conference on Defects in Semiconductors held July 27-31, 2015 in Espoo, Finland.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English