skip to main content

SciTech ConnectSciTech Connect

Title: Comparison of Beta Backscatter and X-ray Fluorescence Methods to Measure Coating Thickness.

Abstract not provided.
Authors:
;
Publication Date:
OSTI Identifier:
1307266
Report Number(s):
SAND2015-6397C
601129
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the LLNL Poster Symposium held August 6, 2015 in Livermore, CA.
Research Org:
Sandia National Laboratories (SNL-CA), Livermore, CA (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English