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Title: Method and apparatus for wavefront sensing

A method of measuring characteristics of a wavefront of an incident beam includes obtaining an interferogram associated with the incident beam passing through a transmission mask and Fourier transforming the interferogram to provide a frequency domain interferogram. The method also includes selecting a subset of harmonics from the frequency domain interferogram, individually inverse Fourier transforming each of the subset of harmonics to provide a set of spatial domain harmonics, and extracting a phase profile from each of the set of spatial domain harmonics. The method further includes removing phase discontinuities in the phase profile, rotating the phase profile, and reconstructing a phase front of the wavefront of the incident beam.
Authors:
Publication Date:
OSTI Identifier:
1303529
Report Number(s):
9,423,306
14/587,392
DOE Contract Number:
FC52-08NA28302
Resource Type:
Patent
Resource Relation:
Patent File Date: 2014 Dec 31
Research Org:
RAM PHOTONICS, LLC, San Diego, CA (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS