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Title: Generation of Homogeneous and Patterned Electron Beams using a Microlens Array Laser-Shaping Technique

In photocathodes the achievable electron-beam parameters are controlled by the laser used to trigger the photoemission process. Non-ideal laser distribution hampers the final beam quality. Laser inhomogeneities, for instance, can be "amplified" by space-charge force and result in fragmented electron beams. To overcome this limitation laser shaping methods are routinely employed. In the present paper we demonstrate the use of simple microlens arrays to dramatically improve the transverse uniformity. We also show that this arrangement can be used to produce transversely-patterned electron beams. Our experiments are carried out at the Argonne Wakefield Accelerator facility.
Authors:
 [1] ;  [2] ;  [3] ;  [3] ;  [1] ;  [3] ;  [4] ;  [2] ;  [2] ;  [3]
  1. NICADD, DeKalb
  2. Fermilab
  3. Argonne, HEP
  4. Unlisted, CN
Publication Date:
OSTI Identifier:
1294437
Report Number(s):
FERMILAB-CONF-16-213-APC
1470668
DOE Contract Number:
AC02-07CH11359
Resource Type:
Conference
Resource Relation:
Conference: 7th International Particle Accelerator Conference, Busan, Korea, 05/08-05/13/2016
Research Org:
Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS