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Title: Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon

Journal Article · · Physical Review Letters

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
OSTI ID:
1274768
Journal Information:
Physical Review Letters, Vol. 117, Issue 4; ISSN 0031-9007
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
ENGLISH

References (34)

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Cited By (10)

Detonation synthesis of carbon nano-onions via liquid carbon condensation journal August 2019
Phase transition lowering in dynamically compressed silicon journal September 2018
Graphical method for analyzing wide-angle x-ray diffraction journal January 2018
Kinetics and structural changes in dynamically compressed bismuth journal August 2019
Direct Observations of a Dynamically Driven Phase Transition with in situ X-Ray Diffraction in a Simple Ionic Crystal journal December 2017
Nanosecond Melting and Recrystallization in Shock-Compressed Silicon journal September 2018
Structural Transformation and Melting in Gold Shock Compressed to 355 GPa journal July 2019
Real-Time Observation of Stacking Faults in Gold Shock Compressed to 150 GPa journal January 2020
Direct imaging of ultrafast lattice dynamics journal March 2019
Direct imaging of ultrafast lattice dynamics text January 2019

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