skip to main content

Title: Part damage due to proximity effects during sub-micron additive manufacturing via two-photon lithography

Authors:
; ; ;
Publication Date:
OSTI Identifier:
1274047
Report Number(s):
LLNL-CONF-679759
DOE Contract Number:
AC52-07NA27344
Resource Type:
Conference
Resource Relation:
Conference: Presented at: ASME Manufacturing Science and Engineering Conference 2016, Blacksburg, MA, United States, Jun 27 - Jul 01, 2016
Research Org:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS