Real time SAXS studies of lamellar level morphological development in PEEK
- Virginia Tech, Blacksburg, VA (United States)
- SUNY, Stony Brook, NY (United States); and others
The double endotherm melting behavior of poly(aryl ether ether ketone) PEEK has been the subject of considerable debate during the last few years. Most authors are of the opinion that this behavior is caused either by a melting-recrystallization phenomenon or by the presence of two populations of lamellar thicknesses. In this paper, the double endothermic behavior of PEEK is studied using real time small angle X-ray scattering (SAXS). The correlation and interface distribution functions were used to analyze SAXS data. Calculations presented in this paper suggest that the semi-crystalline morphology of PEEK consists of two type of lamellar stacks consistent with primary and secondary crystallization. The lamellar thickness within these 2 stacks are observed to be about 70 A and 120 A (secondary and primary lamellae respectively) for PEEK crystallized at 307{degrees}C. Based on these observations, we speculate the that double endotherm melting behavior might be related to the melting of these dual stacks of lamellae.
- OSTI ID:
- 126898
- Report Number(s):
- CONF-950402-; TRN: 95:006086-0957
- Resource Relation:
- Conference: 209. American Chemical Society (ACS) national meeting, Anaheim, CA (United States), 2-6 Apr 1995; Other Information: PBD: 1995; Related Information: Is Part Of 209th ACS national meeting; PB: 2088 p.
- Country of Publication:
- United States
- Language:
- English
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