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Title: An electron microscopy study of dislocation structures in Mg single crystals compressed along [0 0 0 1] at room temperature

We compressed Mg single crystals along [0 0 0 1] at room temperature to various stress levels (40, 80, 120, 160 and 320 MPa) and the evolution of dislocation structure with stress increment was investigated by TEM slip is confirmed to be the dominant deformation mode; the predominance of edge dislocation debris lying along the <1 0 $$\bar{1}$$ 0> implies that screw dislocations are more mobile than their edge counterpart. The edge dislocation may dissociate into and dislocations, and the latter can extend further on the basal plane and bound a basal-stacking fault.
Authors:
 [1] ;  [2] ;  [1] ;  [3]
  1. Brown Univ., Providence, RI (United States)
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  3. GM Global Research and Development Center, Warren, MI (United States)
Publication Date:
OSTI Identifier:
1265975
DOE Contract Number:
AC05-00OR22725
Resource Type:
Journal Article
Resource Relation:
Journal Name: Philosophical Magazine (2003, Print); Journal Volume: 95; Journal Issue: 35
Publisher:
Taylor & Francis
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE