An electron microscopy study of dislocation structures in Mg single crystals compressed along [0 0 0 1] at room temperature

Journal Article · Sat Jan 09 00:00:00 EST 2016 · Philosophical Magazine (2003, Print)

DOI:https://doi.org/10.1080/14786435.2015.1108531· OSTI ID:1265975

Kumar, K. S. ^[1]; Chisholm, Matthew F. ^[2]; Geng, J. ^[1]; Mishra, R. K. ^[3]

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1. Brown Univ., Providence, RI (United States)
2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
3. GM Global Research and Development Center, Warren, MI (United States)

We compressed Mg single crystals along [0 0 0 1] at room temperature to various stress levels (40, 80, 120, 160 and 320 MPa) and the evolution of dislocation structure with stress increment was investigated by TEM slip is confirmed to be the dominant deformation mode; the predominance of edge dislocation debris lying along the <1 0 $$\bar{1}$$ 0> implies that screw dislocations are more mobile than their edge counterpart. The edge dislocation may dissociate into and dislocations, and the latter can extend further on the basal plane and bound a basal-stacking fault.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1265975
• Journal Information: Philosophical Magazine (2003, Print), Vol. 95, Issue 35; ISSN 1478-6435
• Publisher: Taylor & Francis
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE