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Title: Advanced techniques for characterization of ion beam modified materials

Journal Article · · Current Opinion in Solid State and Materials Science
 [1];  [2];  [3];  [4];  [5]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Univ. of Tennessee, Knoxville, TN (United States)
  2. Centre de Sciences Nucleaires et de Sciences de la Matiere, Universite Paris-Sud (France)
  3. Centre Europeen de la Ceramique, Limoges Cedex (France)
  4. Australian National Univ., Canberra, ACT (Australia)
  5. Aalto Univ., Otaniemi (Finland)

Understanding the mechanisms of damage formation in materials irradiated with energetic ions is essential for the field of ion-beam materials modification and engineering. Utilizing incident ions, electrons, photons, and positrons, various analysis techniques, including Rutherford backscattering spectrometry (RBS), electron RBS, Raman spectroscopy, high-resolution X-ray diffraction, small-angle X-ray scattering, and positron annihilation spectroscopy, are routinely used or gaining increasing attention in characterizing ion beam modified materials. The distinctive information, recent developments, and some perspectives in these techniques are reviewed in this paper. Applications of these techniques are discussed to demonstrate their unique ability for studying ion-solid interactions and the corresponding radiation effects in modified depths ranging from a few nm to a few tens of μm, and to provide information on electronic and atomic structure of the materials, defect configuration and concentration, as well as phase stability, amorphization and recrystallization processes. Finally, such knowledge contributes to our fundamental understanding over a wide range of extreme conditions essential for enhancing material performance and also for design and synthesis of new materials to address a broad variety of future energy applications.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
AC05-00OR22725
OSTI ID:
1265307
Alternate ID(s):
OSTI ID: 1251259
Journal Information:
Current Opinion in Solid State and Materials Science, Vol. 19, Issue 1; ISSN 1359-0286
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 43 works
Citation information provided by
Web of Science

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Cited By (6)

Highly Selective Ionic Transport through Subnanometer Pores in Polymer Films journal July 2016
Ionization-induced annealing of pre-existing defects in silicon carbide journal August 2015
Ion beam modification of two-dimensional materials: Characterization, properties, and applications journal March 2017
Investigation of the radiation resistance of nitride ceramics during irradiation with low-energy journal October 2018
Interaction of low-energy muons with defect profiles in proton-irradiated Si and 4 H -SiC journal September 2019
Formation of swift heavy ion tracks on a rutile TiO 2 (001) surface journal September 2016