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Title: Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

Here we present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.
 [1] ;  [2] ;  [2]
  1. KTH Royal Inst. of Technology, Stockholm (Sweden); Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
  2. KTH Royal Inst. of Technology, Stockholm (Sweden)
Publication Date:
OSTI Identifier:
Accepted Manuscript
Journal Name:
Beilstein Journal of Nanotechnology
Additional Journal Information:
Journal Volume: 5; Journal ID: ISSN 2190-4286
Beilstein Institute
Research Org:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org:
Country of Publication:
United States
74 ATOMIC AND MOLECULAR PHYSICS; atomic force microscopy; calibration; multimodal AFM; multifrequency AFM