Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

Borysov, Stanislav S.; Forchheimer, Daniel; Haviland, David B.

doi:10.3762/bjnano.5.200

Title: Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

Journal Article · Wed Oct 29 00:00:00 EDT 2014 · Beilstein Journal of Nanotechnology

DOI:https://doi.org/10.3762/bjnano.5.200· OSTI ID:1263563

Borysov, Stanislav S. ^[1]; Forchheimer, Daniel ^[2]; Haviland, David B. ^[2]

KTH Royal Inst. of Technology, Stockholm (Sweden); Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
KTH Royal Inst. of Technology, Stockholm (Sweden)

Here we present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip–surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip–surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.

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Research Organization:: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)

Sponsoring Organization:: USDOE

OSTI ID:: 1263563

Journal Information:: Beilstein Journal of Nanotechnology, Vol. 5; ISSN 2190-4286

Publisher:: Beilstein InstituteCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 5 works

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References (35)

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Title: Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

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