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Title: Impact of Interface Defects on Tunneling FET Turn-on Steepness.

Abstract not provided.
Authors:
; ; ;
Publication Date:
OSTI Identifier:
1262936
Report Number(s):
SAND2015-5522C
594852
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Berkeley Symposium on Energy Efficient Electronics held October 1-2, 2015 in Berkeley, CA.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
NSF
Country of Publication:
United States
Language:
English