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Title: Time-dependent analysis of visible helium line-ratios for electron temperature and density diagnostic using synthetic simulations on NSTX-U

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4955286· OSTI ID:1259296
ORCiD logo [1];  [2];  [2];  [1];  [1]
  1. Johns Hopkins Univ., Baltimore, MD (United States). Department of Physics and Astronomy
  2. Univ. of Wisconsin, Madison, WI (United States). Dept. of Engineering Physics

Helium line-ratios for electron temperature (Te) and density (ne) plasma diagnostic in the Scrape-Off-Layer (SOL) and Edge regions of tokamaks are widely used. Due to their intensities and proximity of wavelengths, the singlet 667.8 and 728.1 nm, and triplet 706.5 nm visible lines have been typically preferred. Time-dependency of the triplet line (706.5 nm) has been previously analyzed in detail by including transient effects on line-ratios during gas-puff diagnostic applications. In this work, several line-ratio combinations within each of the two spin systems are analyzed with the purpose of eliminating transient effects to extend the application of this powerful diagnostic to high temporal resolution characterization of plasmas. The analysis is done using synthetic emission modeling and diagnostic for low electron density NSTX SOL plasma conditions by several visible lines. Quasi-static equilibrium, and time-dependent models are employed to evaluate transient effects of the atomic population levels that may affect the derived electron temperatures and densities as the helium gas-puff penetrates the plasma. Ultimately, the analysis of a wider range of spectral lines will help to extend this powerful diagnostic to experiments where the wavelength range of the measured spectra may be constrained either by limitations of the spectrometer, or by other conflicting lines from different ions.

Research Organization:
Johns Hopkins Univ., Baltimore, MD (United States); Univ. of Wisconsin, Madison, WI (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
S0000787; AC02-09CH11466
OSTI ID:
1259296
Journal Information:
Review of Scientific Instruments, Vol. 87, Issue 11; Conference: 21. Topical Conference on High-Temperature Plasma Diagnostics (HTPD 2016), Madison, WI (United States), 5-9 Jun 2016; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 5 works
Citation information provided by
Web of Science

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Time dependent analysis of visible helium line-ratios for electron temperature and density diagnostic using synthetic simulations on NSTX-U dataset January 2016
Time dependent analysis of visible helium line-ratios for electron temperature and density diagnostic using synthetic simulations on NSTX-U dataset January 2016

Cited By (3)

Invited Review Article: Gas puff imaging diagnostics of edge plasma turbulence in magnetic fusion devices journal April 2017
Time dependent analysis of visible helium line-ratios for electron temperature and density diagnostic using synthetic simulations on NSTX-U dataset January 2016
Time dependent analysis of visible helium line-ratios for electron temperature and density diagnostic using synthetic simulations on NSTX-U dataset January 2016