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Title: G-mode magnetic force microscopy: Separating magnetic and electrostatic interactions using big data analytics

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4948601· OSTI ID:1257904
 [1];  [1];  [2];  [3]; ORCiD logo [4];  [5]; ORCiD logo [1];  [1]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  2. Asylum Research, Santa Barbara, CA (United States)
  3. Univ. of Science and Technology, Beijing (China); Univ. of Tennessee, Knoxville, TN (United States)
  4. Univ. of Science and Technology, Beijing (China)
  5. Univ. of Tennessee, Knoxville, TN (United States)

We develop a full information capture approach for Magnetic Force Microscopy (MFM), referred to as generalized mode (G-Mode) MFM. G-Mode MFM acquires and stores the full data stream from the photodetector at sampling rates approaching the intrinsic photodiode limit. The data can be subsequently compressed, denoised, and analyzed, without information loss. Also, 3 G-Mode MFM is implemented and compared to traditional heterodyne based MFM on model systems including domain structures in ferromagnetic Yttrium Iron Garnet (YIG) and electronically and magnetically inhomogeneous high entropy alloy, CoFeMnNiSn. We investigate the use of information theory to mine the G-Mode MFM data and demonstrate its usefulness for extracting information which may be hidden in traditional MFM modes, including signatures of nonlinearities and mode coupling phenomena. Finally we demonstrate detection and separation of magnetic and electrostatic tip-sample interactions from a single G-Mode image, by analyzing the entire frequency response of the cantilever. G-Mode MFM is immediately implementable on any AFM platform and as such is expected to be a useful technique for probing spatiotemporal cantilever dynamics and mapping material properties as well as their mutual interactions.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
AC05-00OR22725
OSTI ID:
1257904
Journal Information:
Applied Physics Letters, Vol. 108, Issue 19; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 20 works
Citation information provided by
Web of Science

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Cited By (9)

Ultrafast current imaging by Bayesian inversion journal February 2018
Mapping intrinsic electromechanical responses at the nanoscale via sequential excitation scanning probe microscopy empowered by deep data journal September 2018
Understanding electrostatic and magnetic forces in magnetic force microscopy: towards single superparamagnetic nanoparticle resolution journal July 2018
Frontiers of magnetic force microscopy journal February 2019
Deep neural networks for understanding noisy data applied to physical property extraction in scanning probe microscopy journal February 2019
Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques journal December 2018
Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space journal August 2016
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review journal July 2018
Mapping Intrinsic Electromechanical Responses at the Nanoscale via Sequential Excitation Scanning Probe Microscopy Empowered by Deep Data text January 2018

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