skip to main content

Title: Introduction to Special Issue on Advances and Applications of Surface Analysis Methods

Abstract: Introduction to the special issue on surface analysis, providing thumbnail sketches of several popular techniques. A table gives the capabilities of each technique.
Authors:
Publication Date:
OSTI Identifier:
1254554
Report Number(s):
PNNL-SA-115413
Journal ID: ISSN 1551-9295; applab; KP1704020
DOE Contract Number:
AC05-76RL01830
Resource Type:
Journal Article
Resource Relation:
Journal Name: Microscopy Today; Journal Volume: 24; Journal Issue: 02
Publisher:
Cambridge University Press
Research Org:
Pacific Northwest National Laboratory (PNNL), Richland, WA (US)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
Surface analysis methods, XPS, SIMS, AES, LEIS