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Title: Depth resolved domain mapping in tetragonal SrTiO3 by micro-Laue diffraction

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4948351· OSTI ID:1253090
 [1];  [2];  [3];  [1];  [3];  [2];  [2];  [2];  [2]
  1. Stanford Univ., Stanford, CA (United States)
  2. Stanford Univ., Stanford, CA (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
  3. Argonne National Lab. (ANL), Argonne, IL (United States)

Here, we present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO3. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (x- and z-axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.

Research Organization:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
AC02-76SF00515; AC02-06CH11357
OSTI ID:
1253090
Alternate ID(s):
OSTI ID: 1250391
Report Number(s):
SLAC-PUB-16523
Journal Information:
Applied Physics Letters, Vol. 108, Issue 18; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 5 works
Citation information provided by
Web of Science

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  • Kajiwara, Kentaro; Ozaki, Tōru; Sakaue, Hiroaki
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Cited By (2)

Physics of SrTiO 3 -based heterostructures and nanostructures: a review journal February 2018
Physics of SrTiO$_3$-based heterostructures and nanostructures: a review text January 2017

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