Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity
Abstract
An acceleration model based on the Peck equation was applied to power performance of crystalline silicon cell modules as a function of time and of temperature and humidity, the two main environmental stress factors that promote potential-induced degradation. This model was derived from module power degradation data obtained semi-continuously and statistically by in-situ dark current-voltage measurements in an environmental chamber. The modeling enables prediction of degradation rates and times as functions of temperature and humidity. Power degradation could be modeled linearly as a function of time to the second power; additionally, we found that coulombs transferred from the active cell circuit to ground during the stress test is approximately linear with time. Therefore, the power loss could be linearized as a function of coulombs squared. With this result, we observed that when the module face was completely grounded with a condensed phase conductor, leakage current exceeded the anticipated corresponding degradation rate relative to the other tests performed in damp heat.
- Authors:
- Publication Date:
- Research Org.:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- OSTI Identifier:
- 1250678
- Report Number(s):
- NREL/CP-5J00-64449
- DOE Contract Number:
- AC36-08GO28308
- Resource Type:
- Conference
- Resource Relation:
- Conference: Presented at the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), 14-19 June 2015, New Orleans, Louisiana; Related Information: Proceedings of the 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), 14-19 June 2015, New Orleans, Louisiana
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; 36 MATERIALS SCIENCE; photovoltaic modules; potential-induced degradation; silicon; solar cells
Citation Formats
Hacke, Peter, Spataru, Sergiu, Terwilliger, Kent, Perrin, Greg, Glick, Stephen, Kurtz, Sarah, and Wohlgemuth, John. Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity. United States: N. p., 2015.
Web. doi:10.1109/PVSC.2015.7355627.
Hacke, Peter, Spataru, Sergiu, Terwilliger, Kent, Perrin, Greg, Glick, Stephen, Kurtz, Sarah, & Wohlgemuth, John. Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity. United States. https://doi.org/10.1109/PVSC.2015.7355627
Hacke, Peter, Spataru, Sergiu, Terwilliger, Kent, Perrin, Greg, Glick, Stephen, Kurtz, Sarah, and Wohlgemuth, John. 2015.
"Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity". United States. https://doi.org/10.1109/PVSC.2015.7355627.
@article{osti_1250678,
title = {Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity},
author = {Hacke, Peter and Spataru, Sergiu and Terwilliger, Kent and Perrin, Greg and Glick, Stephen and Kurtz, Sarah and Wohlgemuth, John},
abstractNote = {An acceleration model based on the Peck equation was applied to power performance of crystalline silicon cell modules as a function of time and of temperature and humidity, the two main environmental stress factors that promote potential-induced degradation. This model was derived from module power degradation data obtained semi-continuously and statistically by in-situ dark current-voltage measurements in an environmental chamber. The modeling enables prediction of degradation rates and times as functions of temperature and humidity. Power degradation could be modeled linearly as a function of time to the second power; additionally, we found that coulombs transferred from the active cell circuit to ground during the stress test is approximately linear with time. Therefore, the power loss could be linearized as a function of coulombs squared. With this result, we observed that when the module face was completely grounded with a condensed phase conductor, leakage current exceeded the anticipated corresponding degradation rate relative to the other tests performed in damp heat.},
doi = {10.1109/PVSC.2015.7355627},
url = {https://www.osti.gov/biblio/1250678},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jun 14 00:00:00 EDT 2015},
month = {Sun Jun 14 00:00:00 EDT 2015}
}