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Title: Continuous scanning mode for ptychography

Journal Article · · Optics Letters
DOI:https://doi.org/10.1364/OL.39.006066· OSTI ID:1249197

We outline how ptychographic imaging can be performed without the need for discrete scan positions. Through an idealized experiment, we demonstrate how a discrete-position scan regime can be replaced with a continuously scanned one with suitable modification of the reconstruction scheme based on coherent modes. The impact of this is that acquisition times can be reduced, significantly aiding ptychographic imaging with x rays, electrons, or visible light.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
National Science Foundation (NSF); European Research Council (ERC); USDOE Office of Science (SC), Basic Energy Sciences (BES)
DOE Contract Number:
AC02-06CH11357
OSTI ID:
1249197
Journal Information:
Optics Letters, Vol. 39, Issue 20; ISSN 0146-9592
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English

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Cited By (11)

X-ray Microscopy book January 2019
X-ray ptychographic and fluorescence microscopy of frozen-hydrated cells using continuous scanning journal March 2017
Multimodal X-ray imaging of nanocontainer-treated macrophages and calcium distribution in the perilacunar bone matrix journal February 2020
Fly-scan ptychography journal March 2015
On-the-fly scans for X-ray ptychography journal December 2014
Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science journal March 2018
Ptychographic imaging of NaD1 induced yeast cell death journal January 2019
Correction of axial position uncertainty and systematic detector errors in ptychographic diffraction imaging text January 2018
Correction of axial position uncertainty and systematic detector errors in ptychographic diffraction imaging journal August 2018
Multimodal X-ray imaging of nanocontainer-treated macrophages and calcium distribution in the perilacunar bone matrix text January 2020
X-ray microscopy journal July 1965

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