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Title: Generation-Recombination in Radiation Damaged III-V Heterojunction Bipolar Transistors.

Abstract not provided.
Authors:
; ; ;
Publication Date:
OSTI Identifier:
1248664
Report Number(s):
SAND2015-2663C
581991
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the 2015 Hardened Electronics and Radiation Technology Technical Interchange Meeting held April 21-24, 2015 in Chantilly, VA.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English