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Title: Neutron-Induced Failures in Semiconductor Devices

This slide presentation explores single event effect, environmental neutron flux, system response, the Los Alamos Neutron Science Center (LANSCE) neutron testing facility, examples of SEE measurements, and recent interest in thermal neutrons.
Authors:
 [1]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Publication Date:
OSTI Identifier:
1248097
Report Number(s):
LA-UR--16-22309
DOE Contract Number:
AC52-06NA25396
Resource Type:
Technical Report
Research Org:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING