The study of frequency-scan photothermal reflectance technique for thermal diffusivity measurement

Hua, Zilong; Ban, Heng; Hurley, David H.

doi:10.1063/1.4919609

Title: The study of frequency-scan photothermal reflectance technique for thermal diffusivity measurement

Journal Article · Tue May 05 00:00:00 EDT 2015 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4919609· OSTI ID:1245830

Hua, Zilong ^[1]; Ban, Heng ^[1]; Hurley, David H. ^[2]

Utah State Univ., Logan, UT (United States)
Idaho National Lab. (INL), Idaho Falls, ID (United States)

A frequency scan photothermal reflectance technique to measure thermal diffusivity of bulk samples is studied in this manuscript. Similar to general photothermal reflectance methods, an intensity-modulated heating laser and a constant intensity probe laser are used to determine the surface temperature response under sinusoidal heating. The approach involves fixing the distance between the heating and probe laser spots, recording the phase lag of reflected probe laser intensity with respect to the heating laser frequency modulation, and extracting thermal diffusivity using the phase lag – (frequency)^1/2 relation. The experimental validation is performed on three samples (SiO₂, CaF₂ and Ge), which have a wide range of thermal diffusivities. The measured thermal diffusivity values agree closely with literature values. Lastly, compared to the commonly used spatial scan method, the experimental setup and operation of the frequency scan method are simplified, and the uncertainty level is equal to or smaller than that of the spatial scan method.

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Research Organization:: Idaho National Lab. (INL), Idaho Falls, ID (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC07-05ID14517

OSTI ID:: 1245830

Report Number(s):: INL/JOU-14-33926; RSINAK

Journal Information:: Review of Scientific Instruments, Vol. 86, Issue 5; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 12 works

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References (19)

Detection of thermal waves through optical reflectance Rosencwaig, Allan; Opsal, Jon; Smith, W. L. Applied Physics Letters, Vol. 46, Issue 11 https://doi.org/10.1063/1.95794	journal	June 1985
Transient thermoreflectance from thin metal films Paddock, Carolyn A.; Eesley, Gary L. Journal of Applied Physics, Vol. 60, Issue 1, p. 285-290 https://doi.org/10.1063/1.337642	journal	July 1986
Energy propagation of thermal waves Salazar, Agustín European Journal of Physics, Vol. 27, Issue 6 https://doi.org/10.1088/0143-0807/27/6/009	journal	September 2006
Harmonic heat flow in isotropic layered systems and its use for thin film thermal conductivity measurements Reichling, M.; Grönbeck, H. Journal of Applied Physics, Vol. 75, Issue 4 https://doi.org/10.1063/1.356338	journal	February 1994
Micron‐scale thermal characterizations of interfaces parallel or perpendicular to the surface Lepoutre, F.; Balageas, D.; Forge, Ph. Journal of Applied Physics, Vol. 78, Issue 4 https://doi.org/10.1063/1.360137	journal	August 1995
The effect of interface resistances on thermal wave propagation in multi-layered samples Li, Bin-cheng; Zhang, Shu-yi Journal of Physics D: Applied Physics, Vol. 30, Issue 10 https://doi.org/10.1088/0022-3727/30/10/010	journal	May 1997
Parametric study of the frequency-domain thermoreflectance technique Xing, C.; Jensen, C.; Hua, Z. Journal of Applied Physics, Vol. 112, Issue 10 https://doi.org/10.1063/1.4761977	journal	November 2012
Modulated optical reflectance measurements on bulk metals and thin metallic layers Alpern, P.; Wurm, S. Journal of Applied Physics, Vol. 66, Issue 4 https://doi.org/10.1063/1.344385	journal	August 1989
Thermal wave propagation in thin films on substrates Maznev, A. A.; Hartmann, J.; Reichling, M. Journal of Applied Physics, Vol. 78, Issue 9 https://doi.org/10.1063/1.359702	journal	November 1995
Distribution analysis of thermal effusivity for sub-micrometer YBCO thin films using thermal microscope Yagi, T.; Taketoshi, N.; Kato, H. Physica C: Superconductivity, Vol. 412-414 https://doi.org/10.1016/j.physc.2003.12.087	journal	October 2004
Thermoreflectance technique to measure thermal effusivity distribution with high spatial resolution Hatori, Kimihito; Taketoshi, Naoyuki; Baba, Tetsuya Review of Scientific Instruments, Vol. 76, Issue 11 https://doi.org/10.1063/1.2130333	journal	November 2005
Laptop photothermal reflectance measurement instrument assembled with optical fiber components Yarai, Atsushi; Nakanishi, Takuji Review of Scientific Instruments, Vol. 78, Issue 5 https://doi.org/10.1063/1.2736414	journal	May 2007
Photothermal microscopy: Thermal contrast at grain interface in sintered metallic materials Mansanares, A. M.; Velinov, T.; Bozoki, Z. Journal of Applied Physics, Vol. 75, Issue 7 https://doi.org/10.1063/1.356119	journal	April 1994
Complete thermal characterization of film-on-substrate system by modulated thermoreflectance microscopy and multiparameter fitting Li, Bincheng; Roger, J. P.; Pottier, L. Journal of Applied Physics, Vol. 86, Issue 9 https://doi.org/10.1063/1.371520	journal	November 1999
Measurement of the Kapitza resistance across a bicrystal interface Hurley, D. H.; Khafizov, M.; Shinde, S. L. Journal of Applied Physics, Vol. 109, Issue 8 https://doi.org/10.1063/1.3573511	journal	April 2011
The mechanism of modulated optical reflectance imaging of dislocations in silicon Bailey, Jeff; Weber, Eicke R.; Opsal, Jon Journal of Crystal Growth, Vol. 103, Issue 1-4 https://doi.org/10.1016/0022-0248(90)90192-N	journal	June 1990
Photothermal measurements of high T _c superconductors Fanton, J. T.; Mitzi, D. B.; Kapitulnik, A. Applied Physics Letters, Vol. 55, Issue 6 https://doi.org/10.1063/1.101843	journal	August 1989
Spatially localized measurement of thermal conductivity using a hybrid photothermal technique Hua, Zilong; Ban, Heng; Khafizov, Marat Journal of Applied Physics, Vol. 111, Issue 10 https://doi.org/10.1063/1.4716474	journal	May 2012
Optimized thermo-reflectance system for measuring the thermal properties of thin-films and their interfaces Burzo, M. G.; Komarov, P. L.; Raad, P. E. Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium https://doi.org/10.1109/STHERM.2006.1625211	conference	January 2006

Cited By (2)

Electronic contribution in heat transfer at metal-semiconductor and metal silicide-semiconductor interfaces Hamaoui, Georges; Horny, Nicolas; Hua, Zilong Scientific Reports, Vol. 8, Issue 1 https://doi.org/10.1038/s41598-018-29505-4	journal	July 2018
Fiber-based modulated optical reflectance configuration allowing for offset pump and probe beams Fleming, A.; Folsom, C.; Jensen, C. Review of Scientific Instruments, Vol. 87, Issue 12 https://doi.org/10.1063/1.4967469	journal	December 2016

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