skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Picosecond x-ray diagnostics for third and fourth generation synchrotron sources

Abstract

In the DOE-EPSCoR State/National Laboratory partnership grant ``Picosecond x-ray diagnostics for third and fourth generation synchrotron sources'' Dr. DeCamp set forth a partnership between the University of Delaware and Argonne National Laboratory. This proposal aimed to design and implement a series of experiments utilizing, or improving upon, existing time-domain hard x-ray spectroscopies at a third generation synchrotron source. Specifically, the PI put forth three experimental projects to be explored in the grant cycle: 1) implementing a picosecond ``x-ray Bragg switch'' using a laser excited nano-structured metallic film, 2) designing a robust x-ray optical delay stage for x-ray pump-probe studies at a hard x-ray synchrotron source, and 3) building/installing a laser based x-ray source at the Advanced Photon Source for two-color x-ray pump-probe studies.

Authors:
ORCiD logo [1]
  1. Univ. of Delaware, Newark, DE (United States)
Publication Date:
Research Org.:
Univ. of Delaware, Newark, DE (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1244536
Report Number(s):
Final Report DE-FG02-11ER46816
DOE Contract Number:  
SC0007047
Resource Type:
Technical Report
Resource Relation:
Related Information: Gao and DeCamp, Applied Physics Letters, vol 100 191903 (2012)Chen and DeCamp, Journal of Applied Physics vol 112, 013527 (2012)Gao et al, Physical Review B vol 88 014302 (2013)Loether et al, Structural Dynamics vol 1 024301 (2014)Loether et al, Optics Letters, Accepted (2016)
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; Time-resolved x-ray diffraction

Citation Formats

DeCamp, Matthew. Picosecond x-ray diagnostics for third and fourth generation synchrotron sources. United States: N. p., 2016. Web.
DeCamp, Matthew. Picosecond x-ray diagnostics for third and fourth generation synchrotron sources. United States.
DeCamp, Matthew. 2016. "Picosecond x-ray diagnostics for third and fourth generation synchrotron sources". United States.
@article{osti_1244536,
title = {Picosecond x-ray diagnostics for third and fourth generation synchrotron sources},
author = {DeCamp, Matthew},
abstractNote = {In the DOE-EPSCoR State/National Laboratory partnership grant ``Picosecond x-ray diagnostics for third and fourth generation synchrotron sources'' Dr. DeCamp set forth a partnership between the University of Delaware and Argonne National Laboratory. This proposal aimed to design and implement a series of experiments utilizing, or improving upon, existing time-domain hard x-ray spectroscopies at a third generation synchrotron source. Specifically, the PI put forth three experimental projects to be explored in the grant cycle: 1) implementing a picosecond ``x-ray Bragg switch'' using a laser excited nano-structured metallic film, 2) designing a robust x-ray optical delay stage for x-ray pump-probe studies at a hard x-ray synchrotron source, and 3) building/installing a laser based x-ray source at the Advanced Photon Source for two-color x-ray pump-probe studies.},
doi = {},
url = {https://www.osti.gov/biblio/1244536}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Mar 30 00:00:00 EDT 2016},
month = {Wed Mar 30 00:00:00 EDT 2016}
}

Technical Report:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that may hold this item. Keep in mind that many technical reports are not cataloged in WorldCat.

Save / Share: