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Title: Radiation-Induced Resistance Changes in Resistive Memory: Separating Displacement Damage and Ionization and Mapping Sensitive Areas.

Abstract not provided.
Authors:
Publication Date:
OSTI Identifier:
1244464
Report Number(s):
SAND2015-2079PE
569654
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Job interview held March 19, 2015 in Cambridge, MA, United States.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English