Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO 3 thin films

Yang, Yongsoo; Beekman, Christianne; Siemons, Wolter; Schlepütz, Christian M.; Senabulya, Nancy; Clarke, Roy; Christen, Hans M.

doi:10.1063/1.4944749

Title: Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO ₃ thin films

Journal Article · Tue Mar 01 00:00:00 EST 2016 · APL Materials

DOI:https://doi.org/10.1063/1.4944749· OSTI ID:1244129

Yang, Yongsoo; Beekman, Christianne; Siemons, Wolter; Schlepütz, Christian M.; Senabulya, Nancy; Clarke, Roy; Christen, Hans M.

Two structural phase transitions are investigated in highly strained BiFeO3 thin films as a function of film thickness and temperature via synchrotron x-ray diffraction. Both transition temperatures (upon heating: monoclinic MC to monoclinic MA to tetragonal) decrease as the film becomes thinner. A film-substrate interface layer, evidenced by half-order peaks, contributes to this behavior, but at larger thicknesses (above a few nanometers), the temperature dependence results from electrostatic considerations akin to size effects in ferroelectric phase transitions, but observed here for structural phase transitions within the ferroelectric phase. For ultra-thin films, the tetragonal structure is stable to low temperatures. C 2016 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).

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Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-06CH11357; FG02-06ER46273; AC05-00OR22725

OSTI ID:: 1244129

Alternate ID(s):: OSTI ID: 1247948; OSTI ID: 1339283; OSTI ID: 1420554

Journal Information:: APL Materials, Journal Name: APL Materials Vol. 4 Journal Issue: 3; ISSN 2166-532X

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 7 works

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Title: Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO 3 thin films

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Title: Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO ₃ thin films