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Title: Single event upset protection circuit and method

Patent ·
OSTI ID:1243318

An SEU protection circuit comprises first and second storage means for receiving primary and redundant versions, respectively, of an n-bit wide data value that is to be corrected in case of an SEU occurrence; the correction circuit requires that the data value be a 1-hot encoded value. A parity engine performs a parity operation on the n bits of the primary data value. A multiplexer receives the primary and redundant data values and the parity engine output at respective inputs, and is arranged to pass the primary data value to an output when the parity engine output indicates `odd` parity, and to pass the redundant data value to the output when the parity engine output indicates `even` parity. The primary and redundant data values are suitably state variables, and the parity engine is preferably an n-bit wide XOR or XNOR gate.

Research Organization:
Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
Assignee:
TELEDYNE SCIENTIFIC & IMAGING, LLC (Thousand Oaks, CA)
Patent Number(s):
9,292,378
Application Number:
14/290,648
OSTI ID:
1243318
Resource Relation:
Patent File Date: 2014 May 29
Country of Publication:
United States
Language:
English

References (9)

Dynamic RAM (random access memory) with SEU (single event upset) detection patent August 1997
Single event upset detection and protection in an integrated circuit patent April 1999
Single event upset resistant semiconductor circuit element patent April 2003
System and method for recovering from radiation induced memory errors patent May 2005
Single event upset hardened latch patent January 2007
Redundancy circuits hardened against single event upsets patent June 2007
Radiation tolerant combinational logic cell patent February 2009
Techniques for mitigating, detecting, and correcting single event upset effects patent November 2009
Single event upset mitigation patent December 2010