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Title: Determining the Location and Size of Conductive Filaments in TaOx Memristive Devices Using Focused Ion Beam Irradiation.

Abstract not provided.
Authors:
; ; ; ;
Publication Date:
OSTI Identifier:
1241772
Report Number(s):
SAND2014-18441C
540198
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Determining the Location and Size of Conductive Filaments in TaOx Memristive Devices Using Focused Ion Beam Irradiation held October 6, 2014 in Albuquerque, NM.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English