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Title: Gate-set tomography: calibration-free full characterization of quantum devices using error-amplifying circuits.

Abstract not provided.
Authors:
Publication Date:
OSTI Identifier:
1241714
Report Number(s):
SAND2014-18226PE
537846
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the New Horizons in Statistical Decision Theory held September 8-12, 2014 in Oberwolfach, Germany.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English