Antisite Defects in Layered Multiferroic CuCr0.9In0.1P2S6

He, Qian; Belianinov, Alex; Dziaugys, Andrius; Maksymovych, Petro; Vysochanskii, Yulian; Kalinin, Sergei V.; Borisevich, Albina Y.

doi:10.1039/C5NR04779J

Title: Antisite Defects in Layered Multiferroic CuCr_0.9In_0.1P₂S₆

Journal Article · Tue Oct 06 00:00:00 EDT 2015 · Nanoscale

DOI:https://doi.org/10.1039/C5NR04779J· OSTI ID:1240543

He, Qian ^[1]; Belianinov, Alex ^[1]; Dziaugys, Andrius ^[2]; Maksymovych, Petro ^[1]; Vysochanskii, Yulian ^[3]; Kalinin, Sergei V. ^[1]; Borisevich, Albina Y. ^[1]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Vilnius Univ. (Lithuania)
Uzhgorod Univ. (Ukraine)

The CuCr_1-xIn_xP₂S₆ system represents a large family of metal chalcogenophosphates that are unique and promising candidates for 2D materials with functionalities such as ferroelectricity. We carried out detailed microstructural and chemical characterization of these compounds using aberration-corrected STEM, in order to understand the origin of these different ordering phenomena. Quantitative STEM-HAADF imaging and analysis identified the stacking order of an 8-layer thin flake, which leads to the identification of anti-site In³⁺(Cu⁺) doping. We believe that these findings will pave the way towards understanding the ferroic coupling phenomena in van der Waals lamellar compounds, as well as the potential applications in 2-D electronics.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1240543

Journal Information:: Nanoscale, Vol. 7, Issue 44; ISSN 2040-3364

Publisher:: Royal Society of ChemistryCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 6 works

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Title: Antisite Defects in Layered Multiferroic CuCr_0.9In_0.1P₂S₆