System-independent characterization of materials using dual-energy computed tomography
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
In this study, we present a new decomposition approach for dual-energy computed tomography (DECT) called SIRZ that provides precise and accurate material description, independent of the scanner, over diagnostic energy ranges (30 to 200 keV). System independence is achieved by explicitly including a scanner-specific spectral description in the decomposition method, and a new X-ray-relevant feature space. The feature space consists of electron density, ρe, and a new effective atomic number, Ze, which is based on published X-ray cross sections. Reference materials are used in conjunction with the system spectral response so that additional beam-hardening correction is not necessary. The technique is tested against other methods on DECT data of known specimens scanned by diverse spectra and systems. Uncertainties in accuracy and precision are less than 3% and 2% respectively for the (ρe, Ze) results compared to prior methods that are inaccurate and imprecise (over 9%).
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- AC52-07NA27344
- OSTI ID:
- 1240052
- Report Number(s):
- LLNL-JRNL-678559
- Journal Information:
- IEEE Transactions on Nuclear Science, Vol. 63, Issue 1; ISSN 0018-9499
- Publisher:
- Institute of Electrical and Electronics Engineers (IEEE)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Similar Records
Improved tissue assignment using dual-energy computed tomography in low-dose rate prostate brachytherapy for Monte Carlo dose calculation
TP89 - SIRZ Decomposition Spectral Estimation (V.1.0)
Related Subjects
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
62 RADIOLOGY AND NUCLEAR MEDICINE
beam-hardening correction
effective atomic number
electron density
dual-energy computed tomography
quantitative X-ray characterization
photoelectric-compton decomposition
system-independent CT