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Title: Effects of Device Scaling on Angular Single-Event Effects.

Abstract not provided.
Authors:
;
Publication Date:
OSTI Identifier:
1239367
Report Number(s):
SAND2016-0886C
619003
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Microelectronics Reliability & Qualification Working Meeting held February 9-10, 2016 in El Segundo, CA.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English