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Title: Effects of Device Scaling on Angular Single-Event Effects.

Conference ·
OSTI ID:1239367

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1239367
Report Number(s):
SAND2016-0886C; 619003
Resource Relation:
Conference: Proposed for presentation at the Microelectronics Reliability & Qualification Working Meeting held February 9-10, 2016 in El Segundo, CA.
Country of Publication:
United States
Language:
English