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Title: Stress-life Model Sensitivity to Cycle Counting Methods for a Printed Circuit Board Subjected to Random Excitation.

Abstract not provided.
Authors:
;
Publication Date:
OSTI Identifier:
1239092
Report Number(s):
SAND2015-1024C
566988
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the 85th Shock and Vibration Symposium in Reston, VA.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English