Measurement of mean inner potential and inelastic mean free path of ZnO nanowires and nanosheet

Gan, Zhaofeng; Ahn, Seungho; Yu, Hongbin; Smith, David J.; McCartney, Martha R.

doi:10.1088/2053-1591/2/10/105003

Title: Measurement of mean inner potential and inelastic mean free path of ZnO nanowires and nanosheet

Journal Article · Thu Oct 01 00:00:00 EDT 2015 · Materials Research Express (Online)

DOI:https://doi.org/10.1088/2053-1591/2/10/105003· OSTI ID:1238990

Gan, Zhaofeng; Ahn, Seungho; Yu, Hongbin; Smith, David J.; McCartney, Martha R.

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Sponsoring Organization:: USDOE Advanced Research Projects Agency - Energy (ARPA-E)

Grant/Contract Number:: FG02-04ER46168

OSTI ID:: 1238990

Journal Information:: Materials Research Express (Online), Journal Name: Materials Research Express (Online) Vol. 2 Journal Issue: 10; ISSN 2053-1591

Publisher:: IOP PublishingCopyright Statement

Country of Publication:: United Kingdom

Language:: English

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Cited by: 3 works

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References (21)

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