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Title: Electronic structure evolution of fullerene on CH 3NH 3PbI 3

The thickness dependence of fullerene on CH 3NH 3PbI 3 perovskitefilm surface has been investigated by using ultraviolet photoemission spectroscopy (UPS), X-ray photoemission spectroscopy(XPS), and inverse photoemission spectroscopy (IPES). The lowest unoccupied molecular orbital and highest occupied molecular orbital (HOMO) can be observed directly with IPES and UPS. It is observed that the HOMO level in fullerene shifts to lower binding energy. The XPS results show a strong initial shift of core levels to lower binding energy in the perovskite, which indicates that electrons transfer from the perovskitefilm to fullerene molecules. Further deposition of fullerene forms C 60 solid, accompanied by the reduction of the electron transfer. As a result, the strongest electron transfer happened at 1/4 monolayer of fullerene.
 [1] ;  [1] ;  [2] ;  [1] ;  [3] ;  [3] ;  [3] ;  [3] ;  [1]
  1. Univ. of Rochester, Rochester, NY (United States)
  2. Central South Univ., Changsha (People's Republic of China)
  3. Univ. of Nebraska, Lincoln, NE (United States)
Publication Date:
OSTI Identifier:
Grant/Contract Number:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 106; Journal Issue: 11; Journal ID: ISSN 0003-6951
American Institute of Physics (AIP)
Research Org:
Univ. of Nebraska, Lincoln, NE (United States)
Sponsoring Org:
Country of Publication:
United States
36 MATERIALS SCIENCE; dielectric oxides; fullerenes; solar cells; electron transfer; thin films