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Title: Post-Mortem Characterization of Shocked Cu-Be Interfaces Using Electron Backscattered Diffraction (EBSD)

Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1]
  1. Los Alamos National Laboratory
Publication Date:
OSTI Identifier:
1237213
Report Number(s):
LA-UR-15-29056
DOE Contract Number:
AC52-06NA25396
Resource Type:
Conference
Resource Relation:
Conference: Materials Research Society Fall 2015 Meeting ; 2015-11-29 - 2015-12-04 ; Boston, Massachusetts, United States
Research Org:
Los Alamos National Laboratory (LANL)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
Scanning Electron Microscopy, Electron Backscattered Diffraction, EBSD, Dynamic Friction, Multiphase behavior, interface behavior, interferometry, dynamic shear, shock, deformation