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Title: Survey of Potential-Induced Degradation in Thin-Film Modules

Authors:
; ; ; ; ; ; ; ; ; ;
Publication Date:
OSTI Identifier:
1236607
Report Number(s):
NREL/JA-5J00-64982
Journal ID: ISSN 1947-7988
DOE Contract Number:
AC36-08GO28308
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Photonics for Energy; Journal Volume: 5; Journal Issue: 1; Related Information: Journal of Photonics for Energy
Research Org:
NREL (National Renewable Energy Laboratory (NREL), Golden, CO (United States))
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE potential-induced degradation; PID; CdTe; CIGS; thin-film; current-induced degradation; CID; accelerated lifetime testing