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Title: Survey of Potential-Induced Degradation in Thin-Film Modules

Authors:
; ; ; ;
Publication Date:
OSTI Identifier:
1236193
Report Number(s):
NREL/CP-5J00-64786
DOE Contract Number:
AC36-08GO28308
Resource Type:
Conference
Resource Relation:
Conference: Presented at Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII: SPIE Conference, 9-13 August 2015, San Diego, California; Related Information: Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII: Proceedings of SPIE Conference, 9-13 August 2015, San Diego, California
Publisher:
Bellingham, WA: Society of Photo-Optical Instrumentation Engineers (SPIE)
Research Org:
NREL (National Renewable Energy Laboratory (NREL), Golden, CO (United States))
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE potential-induced degradation; PID; CdTe; CIGS; thin film; current-induced degradation; CID; accelerated lifetime testing