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Title: When will low-contrast features be visible in a STEM X-ray spectrum image?

Authors:
 [1]
  1. ORNL
Publication Date:
OSTI Identifier:
1234322
DOE Contract Number:
AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: Microscopy and Microanalysis, Portland, OR, USA, 20150803, 20150803
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
Language:
English