A review of advantages of high-efficiency X-ray spectrum imaging for analysis of nanostructured ferritic alloys

Journal Article · Tue Dec 09 00:00:00 EST 2014 · Journal of Nuclear Materials

DOI:https://doi.org/10.1016/j.jnucmat.2014.11.134· OSTI ID:1234317

Parish, Chad M. ^[1]; Miller, Michael K. ^[1]

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1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Nanostructured ferritic alloys (NFAs) exhibit complex microstructures consisting of 100-500 nm ferrite grains, grain boundary solute enrichment, and multiple populations of precipitates and nanoclusters (NCs). Understanding these materials' excellent creep and radiation-tolerance properties requires a combination of multiple atomic-scale experimental techniques. Recent advances in scanning transmission electron microscopy (STEM) hardware and data analysis methods have the potential to revolutionize nanometer to micrometer scale materials analysis. The application of these methods is applied to NFAs as a test case and is compared to both conventional STEM methods as well as complementary methods such as scanning electron microscopy and atom probe tomography. In this paper, we review past results and present new results illustrating the effectiveness of latest-generation STEM instrumentation and data analysis.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES)
• Grant/Contract Number: AC05-00OR22725
• OSTI ID: 1234317
• Alternate ID(s): OSTI ID: 1246589
• Journal Information: Journal of Nuclear Materials, Vol. 462; ISSN 0022-3115
• Publisher: Elsevier
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE