In situ calibration of a light source in a sensor device
A sensor device is described herein, wherein the sensor device includes an optical measurement system, such as an interferometer. The sensor device further includes a low-power light source that is configured to emit an optical signal having a constant wavelength, wherein accuracy of a measurement output by the sensor device is dependent upon the optical signal having the constant wavelength. At least a portion of the optical signal is directed to a vapor cell, the vapor cell including an atomic species that absorbs light having the constant wavelength. A photodetector captures light that exits the vapor cell, and generates an electrical signal that is indicative of intensity of the light that exits the vapor cell. A control circuit controls operation of the light source based upon the electrical signal, such that the light source emits the optical signal with the constant wavelength.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000
- Assignee:
- Sandia Corporation
- Patent Number(s):
- 9,222,810
- Application Number:
- 14/031,863
- OSTI ID:
- 1234215
- Resource Relation:
- Patent File Date: 2013 Sep 19
- Country of Publication:
- United States
- Language:
- English
Method and apparatus for calibrating a wavelength-tuning interferometer
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patent | February 2006 |
Locking of a laser to an optical interferometer that is stabilized to a reference frequency
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patent | December 2012 |
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